• DocumentCode
    2385175
  • Title

    Electrothermal reduced equivalents of highly integrated electronic systems with multi-port positive fraction foster expansion

  • Author

    d´Alessandro, Vincenzo ; de Magistris, M. ; Magnani, A. ; Rinaldi, Niccolo ; Russo, S.

  • Author_Institution
    Dipt. di Ing. Biomed., Elettron. e delle Telecomun., Univ. di Napoli FEDERICO II, Naples, Italy
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    An effective strategy is proposed for the extraction of reduced electrical equivalents of dynamic thermal models for electronic systems, based on well-established electrical macro-modeling techniques. Properly defined self-heating and mutual thermal impedances of the embedded active elements - preliminarily evaluated via 3-D thermal simulations - are reduced with passive identification methods, and equivalent electrical models are generated with a Foster multi-port synthesis. The technique is devised to determine a compact thermal feedback network, in a form well suited for commercial circuit simulation environments, thus allowing for a coupled electrothermal analysis.
  • Keywords
    circuit simulation; finite element analysis; network synthesis; 3D thermal FEM tool; 3D thermal simulations; Foster multiport synthesis; circuit simulation environments; compact thermal feedback network; coupled electrothermal analysis; dynamic thermal models; electrical macromodeling techniques; electrothermal reduced equivalent models; embedded active elements; equivalent electrical models; highly integrated electronic systems; multiport positive fraction foster expansion; mutual thermal impedances; passive identification methods; reduced electrical equivalent extraction; self-heating; Finite element methods; Heating; Random access memory; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
  • Conference_Location
    Sorrento
  • Print_ISBN
    978-1-4673-1503-6
  • Type

    conf

  • DOI
    10.1109/SaPIW.2012.6222904
  • Filename
    6222904