DocumentCode
2385437
Title
Modelling and Simulation for Safe Following Distance Based on Vehicle Braking Process
Author
Feng, Guangdong ; Wang, Wuhong ; Feng, Jianshuai ; Tan, Huachun ; Li, Feng
Author_Institution
Dept. Transp. Eng., Beijing Inst. of Technol., Beijing, China
fYear
2010
fDate
10-12 Nov. 2010
Firstpage
385
Lastpage
388
Abstract
The Safe following distance is closely associated with vehicle braking process. The braking process consists of three stages. The key problem in this research area is to quantitatively describe each stage. In this paper a framework is presented to model the safe following distance by analyzing the braking process. In this framework we focus on the third braking stage, continuous braking stage, where the random braking phase is complex and difficult to be quantitatively analyzed. Based on analyzing the following drivers´ expectation in the car-following regime in details, we introduce the Hermit interpolation algorithm to understand the field car-following situation. The algorithm can deal with the kinematics information in the random braking phase. By using simulation, we have demonstrated that the modelling framework is practical, effective, more realistic than the former models, as well as avoids the rear-end collision to some extent. Meanwhile the proposed methodology can be used to identify the car-following driver behaviour characteristics and measure the safe distance in car-following regime.
Keywords
braking; road safety; traffic control; vehicle dynamics; Hermit interpolation algorithm; car-following driver behaviour characteristics; car-following regime; continuous braking; field car-following situation; kinematics information; modelling framework; random braking phase; rear-end collision; safe following distance; simulation; vehicle braking process; Driver circuits; Hafnium; Mathematical model; Roads; Safety; Vehicles; driver behaviour; safe following distance(SFD); traffic safety;
fLanguage
English
Publisher
ieee
Conference_Titel
e-Business Engineering (ICEBE), 2010 IEEE 7th International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-8386-0
Electronic_ISBN
978-0-7695-4227-0
Type
conf
DOI
10.1109/ICEBE.2010.66
Filename
5704345
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