C-V-testing of electret transducers

Author

Shchelko, N.S. ; Sokolova, I.M. ; Zakrzhevskiy, V.I.

Author_Institution

Dept. of Dielectrics & Semicond., Electrotech. Univ., St. Petersburg, Russia

fYear

1994

fDate

7-9 Sep 1994

Firstpage

1028

Lastpage

1033

Abstract

A non-destructive method for electret transducers testing is suggested and discussed. The method allows to determine electret-transducers (microphone, telephone, etc.) insert parameters, e.g. electret surface potential air gap width, membrane tension and deflection. The method is based on the insert C-V-characteristic measurements. C-V-testing method can be also used in investigation of electromechanical properties of two roughed surfaces contact, one of the surfaces being dielectric (electret) and allows to optimize the transducer´s geometry and surface potential value

Keywords

electrets; electric current measurement; nondestructive testing; piezoelectric transducers; surface potential; surface topography; voltage measurement; C-V-testing; deflection; electret surface potential air gap width; electret transducers; electromechanical properties; membrane tension; microphone; roughed surfaces contact; surface potential; telephone; transducer´s geometry; Biomembranes; Dielectric measurements; Electrets; Microphones; Nondestructive testing; Optimization methods; Rough surfaces; Surface roughness; Telephony; Transducers;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1994. (ISE 8), 8th International Symposium on

Conference_Location

Paris

Print_ISBN

0-7803-1940-0

Type

conf

DOI

10.1109/ISE.1994.515266

Filename

515266