DocumentCode :
2385477
Title :
IBIS modeling using latency insertion method (LIM)
Author :
Schutt-Aine, José E. ; Tan, Jilin ; Liu, Ping ; Al-Hawari, F. ; Varma, Ambrish
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
97
Lastpage :
100
Abstract :
This paper presents an approach for the transient simulation of I/O buffers described by IBIS models. Using the latency insertion method a formulation can be obtained for the transient behavior of IBIS models and external circuitry. The formulation offers better convergence than traditional Newton-Raphson methods and is therefore more robust. Several computer simulations are performed to validate the method.
Keywords :
circuit simulation; transient analysis; I/O buffer; IBIS modeling; computer simulations; external circuitry; latency insertion method; transient simulation; Abstracts; Accuracy; Integrated circuit modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4673-1503-6
Type :
conf
DOI :
10.1109/SaPIW.2012.6222920
Filename :
6222920
Link To Document :
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