• DocumentCode
    2385477
  • Title

    IBIS modeling using latency insertion method (LIM)

  • Author

    Schutt-Aine, José E. ; Tan, Jilin ; Liu, Ping ; Al-Hawari, F. ; Varma, Ambrish

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    97
  • Lastpage
    100
  • Abstract
    This paper presents an approach for the transient simulation of I/O buffers described by IBIS models. Using the latency insertion method a formulation can be obtained for the transient behavior of IBIS models and external circuitry. The formulation offers better convergence than traditional Newton-Raphson methods and is therefore more robust. Several computer simulations are performed to validate the method.
  • Keywords
    circuit simulation; transient analysis; I/O buffer; IBIS modeling; computer simulations; external circuitry; latency insertion method; transient simulation; Abstracts; Accuracy; Integrated circuit modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
  • Conference_Location
    Sorrento
  • Print_ISBN
    978-1-4673-1503-6
  • Type

    conf

  • DOI
    10.1109/SaPIW.2012.6222920
  • Filename
    6222920
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2385477