Title :
SSO noise and conducted EMI: Modeling, analysis, and design solutions
Author :
Doriol, Patrice Joubert ; Sanna, Aurora ; Chandra, Akhilesh ; Forzan, Cristiano ; Pandini, Davide
Author_Institution :
STMicroelectron., Central CAD & Solutions, Agrate Brianza, Italy
Abstract :
Board-level I/Os´ signal integrity and conducted EMI have become a critical concern for high-speed circuit designers, and a major cause of performance and reliability degradation of modern electronic systems. In this paper we investigate the impact of simultaneous switching output (SSO) noise, and we propose a methodology for SSO analysis and mitigation based on commercial CAD (Computer-Aided Design) tools that can be seamlessly integrated into an industrial design flow. Experimental results obtained on an automotive microcontroller demonstrate the effectiveness of the proposed approach.
Keywords :
automotive electronics; circuit CAD; circuit reliability; electromagnetic interference; high-speed integrated circuits; integrated circuit design; integrated circuit modelling; microcontrollers; SSO analysis; SSO mitigation; SSO noise; automotive microcontroller; board-level I-O signal integrity; commercial CAD tool; computer-aided design; conducted EMI; electronic systems; high-speed circuit designers; industrial design flow; performance degradation; simultaneous switching output noise; Abstracts; Capacitance; Logic gates; Standards; Switches;
Conference_Titel :
Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4673-1503-6
DOI :
10.1109/SaPIW.2012.6222922
