Title :
System fidelity factor in analysis of inverter-interconnect-inverter VLSI systems
Author :
Bandurski, Wojciech
Author_Institution :
Poznan Univ. of Technol., Poznan, Poland
Abstract :
The paper presents the method to classify of the shape of the clock signal distortions and rough estimation of a clock skew by means of system fidelity factor (SFF). The method is based on cross-correlation coefficient calculations for periodic clock signal. The signals are represented by their Fourier series. The steady state in clock distribution networks is assumed. In the paper is presented the formula for SFF coefficient and an example of its calculation.
Keywords :
Fourier series; VLSI; clock distribution networks; distortion; integrated circuit interconnections; invertors; Fourier series; SFF coefficient; clock distribution networks; clock skew rough estimation; cross-correlation coefficient; inverter-interconnect-inverter VLSI system analysis; periodic clock signal distortions; system fidelity factor;
Conference_Titel :
Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4673-1503-6
DOI :
10.1109/SaPIW.2012.6222924
