Title :
Beam dynamics calculations for the LAMPF optically pumped ion source
Author :
Hayden, R.J. ; Jakobson, M.J. ; van Dyck, O.B. ; York, R.L.
Author_Institution :
Phys. & Astron., Montana Univ., Missoula, MT, USA
Abstract :
The space charge code SCHAR has been used to interpret some of the measurements made with the LAMPF ECR (Los Alamos Meson Physics Facility electron cyclotron resonance) source. Calculations were made for rectangular hole (ribbon beam), single hole, and multihole electrodes. Measured rotation of the plane of the ribbon beam in the constant solenoid field showed that when the polarizer cell was not utilized the beam was essentially not neutralized after it emerged from the extraction electrodes. There is evidence that when the polarizer cell is turned on the beam becomes neutralized from the polarizer back toward the electrode structure. The total measured current from single and multihole electrode with the polarizer cell on is proportional to the area of the electrode apertures. Beam simulation calculations indicate that if the beam extracted from the source is uniform across the multihole structure, then in order for the perimeter holes to provide as much current per area the beam would have to be at least partially neutralized after exiting from the electrode structure. The energy of the ions leaving the (unmodeled) ECR plasma determines the current for a given electrode structure and voltage. Electrode radial fields and beam space charge forces generate most of the transverse velocities observed as the beam exits from the electrodes. Tails present in the measured harp data could be explained by an H2+ component in the beam
Keywords :
beam handling techniques; ion sources; optical pumping; ECR plasma; H2+ component; LAMPF optically pumped ion source; beam dynamics; beam simulation; beam space charge forces; constant solenoid field; electrode apertures; electron cyclotron resonance; extraction electrodes; measured harp data; multihole electrodes; polarizer cell; rectangular hole; ribbon beam; single hole; space charge code SCHAR; Charge measurement; Current measurement; Electrodes; Electron optics; Laser excitation; Optical pumping; Particle beam optics; Plasma measurements; Polarization; Space charge;
Conference_Titel :
Particle Accelerator Conference, 1989. Accelerator Science and Technology., Proceedings of the 1989 IEEE
Conference_Location :
Chicago, IL
DOI :
10.1109/PAC.1989.73279