Title :
Impact of radiation loss in on-chip transmission-line for terahertz applications
Author :
Tsuchiya, Akira ; Onodera, Hidetoshi
Author_Institution :
Dept. of Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
Abstract :
This paper discusses radiation loss of on-chip transmission-line. Since terahertz applications of integrated circuits are emerging, precise modeling in terahertz region is needed. We evaluate conductor loss, dielectric loss and radiation loss of on-chip transmission-line by a full-wave field solver. Simulation results show that design focusing conductor loss may cause large radiation loss in terahertz region. Quantitative evaluation of the impact of radiation loss is demonstrated. Also we show that thick signal wire and differential line is effective to reduce the loss.
Keywords :
dielectric losses; terahertz wave generation; transmission lines; conductor loss; dielectric loss; full-wave field solver; integrated circuits; on-chip transmission-line; radiation loss; terahertz applications; Aluminum; Copper; Rectangular waveguides; Yarn;
Conference_Titel :
Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4673-1503-6
DOI :
10.1109/SaPIW.2012.6222926