Title :
Table of contents
Abstract :
The following topics are dealt with: leakage reduction; advanced memory device technologies; advanced IC design and integration; advanced transistors; process-induced damage; ultra thin gate dielectric reliability; advanced materials; computer aided design; design for manufacturability; low power IC design; and advanced memory design
Keywords :
design for manufacture; dielectric materials; integrated circuit design; integrated memory circuits; leakage currents; logic design; advanced materials; advanced memory design; advanced transistors; computer aided design; design for manufacturability; leakage reduction; low power IC design; memory device; process-induced damage; ultra thin gate dielectric reliability;
Conference_Titel :
Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on
Conference_Location :
Padova
Print_ISBN :
1-4244-0097-X
DOI :
10.1109/ICICDT.2006.220776
