Title :
Generation, elimination and utilization of harmonics in ring oscillators
Author :
Bhushan, Manjul ; Ketchen, Mark B.
Author_Institution :
Syst. & Technol. Group, IBM, Hopewell Junction, NY, USA
Abstract :
Higher frequency harmonics in ring oscillators are problematic in both data acquisition and analysis. The origin of these undesirable harmonics and a circuit scheme for effectively eliminating them are described. Controlled generation of higher harmonics, on the other hand, enables unique applications in determining circuit power performance trade-offs.
Keywords :
harmonic oscillators (circuits); circuit power performance trade-offs; circuit scheme; data acquisition; data analysis; higher frequency harmonics; ring oscillators; Circuit testing; Frequency measurement; Integrated circuit measurements; Power generation; Power measurement; Power system harmonics; Propagation delay; Ring oscillators; Silicon on insulator technology; Voltage; CMOS digital integrated circuits; CMOSFET oscillators; power measurements; silicon-on-insulator technology;
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on
Conference_Location :
Hiroshima
Print_ISBN :
978-1-4244-6912-3
Electronic_ISBN :
978-1-4244-6914-7
DOI :
10.1109/ICMTS.2010.5466847
