Title :
Leakage Power Reduction Techniques applied to 90-nm SoC Application Processor
Author :
Royannez, Philippe ; Mair, Hugh ; Dahan, Franck ; Wagner, Mike ; Streeter, Mark ; Bouetel, Laurent ; Blasquez, Joel ; Clasen, H. ; Semino, G. ; Dong, Julie ; Scott, D. ; Pitts, B. ; Raibaut, Claudine ; Ko, Uming
Abstract :
At the 90-nm, leakage currents bring standby power to an unacceptable level and circuit level techniques become mandatory. However applying these techniques must be robust and practical. In this paper we focus not only on leakage reduction solutions but also on their deployment as a worldwide infrastructure as the added-value resides not only in the techniques themselves but also in the way they are implemented to build an efficient, re-usable, robust, low cost and portable platform. Techniques have been silicon proven on the 90-nm TI CMOS technology and is commonly used to design SoC with complexities over 100 million transistors
Keywords :
CMOS integrated circuits; leakage currents; microprocessor chips; system-on-chip; 90 nm; CMOS technology; SoC application processor; leakage currents; leakage power reduction; system-on-chip; Application software; CMOS logic circuits; CMOS technology; Diodes; Energy management; Graphics; Libraries; Power control; Robustness; Signal design; Leakage Power Management; SoC Design; Wireless Application processor;
Conference_Titel :
Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on
Conference_Location :
Padova
Print_ISBN :
1-4244-0097-X
DOI :
10.1109/ICICDT.2006.220781