DocumentCode
2386487
Title
Investigation of the trap states in quenched and annealed nylon 6 films using thermally stimulated depolarization current
Author
Zhu, J. ; Zhang, X.Y. ; Dai, J.B. ; Chan, H.L.W.
Author_Institution
Dept. of Polymer Sci. & Eng., Univ. of Sci. & Technol. of China, Hefei, China
fYear
2002
fDate
2002
Firstpage
126
Lastpage
129
Abstract
Quenched and annealed nylon 6 films were prepared and their short-circuit thermally stimulated depolarization current (TSDC) has been measured using a modified thermal electric analyzer. The space charge peak in the temperature range of 90°C∼180°C observed in the TSDC spectra of different samples showed that the trap state of the films shifted to lower temperature as annealing time increased. In general, the trap state became shallower in the annealed sample. The result was consistent with the structural transition of quenched β form to annealed α form. FTIR spectrum and X-ray diffraction were also used to examine the transition. According to the analysis of the phase transition, structural origin of the TSDC peaks has been proposed.
Keywords
Fourier transform spectra; X-ray diffraction; annealing; dielectric thin films; electron traps; infrared spectra; polymer films; polymer structure; quenching (thermal); solid-state phase transformations; space charge; thermally stimulated currents; 90 to 180 C; FTIR spectrum; TSDC; TSDC spectra; X-ray diffraction; annealed α form; annealed nylon 6 films; annealing time; modified thermal electric analyzer; phase transition; quenched β form; quenched nylon 6 films; short-circuit thermally stimulated depolarization; space charge peak; structural transition; thermally stimulated depolarization current; trap states; Annealing; Crystallization; Materials science and technology; Physics; Polarization; Polymers; Space charge; Temperature distribution; Thermal quenching; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
Print_ISBN
0-7803-7560-2
Type
conf
DOI
10.1109/ISE.2002.1042960
Filename
1042960
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