• DocumentCode
    2386487
  • Title

    Investigation of the trap states in quenched and annealed nylon 6 films using thermally stimulated depolarization current

  • Author

    Zhu, J. ; Zhang, X.Y. ; Dai, J.B. ; Chan, H.L.W.

  • Author_Institution
    Dept. of Polymer Sci. & Eng., Univ. of Sci. & Technol. of China, Hefei, China
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    126
  • Lastpage
    129
  • Abstract
    Quenched and annealed nylon 6 films were prepared and their short-circuit thermally stimulated depolarization current (TSDC) has been measured using a modified thermal electric analyzer. The space charge peak in the temperature range of 90°C∼180°C observed in the TSDC spectra of different samples showed that the trap state of the films shifted to lower temperature as annealing time increased. In general, the trap state became shallower in the annealed sample. The result was consistent with the structural transition of quenched β form to annealed α form. FTIR spectrum and X-ray diffraction were also used to examine the transition. According to the analysis of the phase transition, structural origin of the TSDC peaks has been proposed.
  • Keywords
    Fourier transform spectra; X-ray diffraction; annealing; dielectric thin films; electron traps; infrared spectra; polymer films; polymer structure; quenching (thermal); solid-state phase transformations; space charge; thermally stimulated currents; 90 to 180 C; FTIR spectrum; TSDC; TSDC spectra; X-ray diffraction; annealed α form; annealed nylon 6 films; annealing time; modified thermal electric analyzer; phase transition; quenched β form; quenched nylon 6 films; short-circuit thermally stimulated depolarization; space charge peak; structural transition; thermally stimulated depolarization current; trap states; Annealing; Crystallization; Materials science and technology; Physics; Polarization; Polymers; Space charge; Temperature distribution; Thermal quenching; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
  • Print_ISBN
    0-7803-7560-2
  • Type

    conf

  • DOI
    10.1109/ISE.2002.1042960
  • Filename
    1042960