DocumentCode
2386876
Title
Design-Technology Interface: What will replace design rules for DDSM?
Author
Lavin, Mark
Author_Institution
Design-Technol. Integration, IBM Syst. Technol. Group, East Fishkill, NY
fYear
0
fDate
0-0 0
Firstpage
1
Lastpage
1
Abstract
Summary form only given. It is now well-accepted that CMOS technology has entered a new era where the rapid, steady quantitative scaling of performance, density, etc. appears to be slowing, and is subject to new impediments (noise, static and dynamic power) as well as qualitative, sometimes disruptive change in processes, materials, and devices. One of the main contributors to this slowing and complication is the increasing impact of variability. What I want to discuss in this paper is how variability also impacts the interface between chip design and technology development. Historically, this interface was represented by design rules and device/wire models that scaled smoothly over time; this was reflected by the fact that IBM\´s processor technologies from the frac12 micron node down to the 130nm node used a (mostly) stable set of scalable design rules and circuit models in which there was a single "NRN" dimension of variability. Going forward, it is clear that the models and the design tools that use them have to capture a more complete understanding of systematic and random variability, and conventional design rules have to replaced by other means for representing to designers what the new technologies are (and are not) capable of. I spent most of my talk describing some potential replacements for conventional design rules
Keywords
CMOS integrated circuits; integrated circuit design; integrated circuit technology; CMOS technology; DDSM; NRN dimension; chip design; circuit models; design rules; design tools; design-technology interface; device model; random variability; systematic variability; technology development; variability impact; wire models; CMOS process; CMOS technology; Chip scale packaging; Circuits; Delta-sigma modulation; Impedance; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on
Conference_Location
Padova
Print_ISBN
1-4244-0097-X
Type
conf
DOI
10.1109/ICICDT.2006.220819
Filename
1669406
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