DocumentCode :
2386927
Title :
Application of Global Loops on ULSI Routing for DfY
Author :
Panitz, P. ; Olbrich, M. ; Koehl, J. ; Barke, E.
Author_Institution :
Inst. of Microelectron. Syst., Hannover Univ.
fYear :
0
fDate :
0-0 0
Firstpage :
1
Lastpage :
4
Abstract :
The number of circuit malfunctions due to opens increases with shrinking technologies. This requires reconsidering traditional tree based routing approaches for signal wiring. In this paper, we apply global loops to generate robust net topologies which are fully immune against single open faults. We show that the solution of the traveling salesperson problem yields a nearly optimal solution to the two edge connected subgraph problem. Additionally, we introduce a heuristic for finding additional segments which significantly reduce the delay. As result the critical area reduction is better than in previous published approaches which augment minimum Steiner trees
Keywords :
ULSI; integrated circuit design; integrated circuit interconnections; integrated circuit yield; linear programming; travelling salesman problems; tree searching; DfY; ULSI routing; circuit malfunctions; critical area reduction; delay reduction; global loops; open faults; robust net topologies; signal wiring; subgraph problem; traveling salesperson problem; tree-based routing; Circuit faults; Delay; Joining processes; Microelectronics; Network topology; Robustness; Routing; Ultra large scale integration; Wire; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on
Conference_Location :
Padova
Print_ISBN :
1-4244-0097-X
Type :
conf
DOI :
10.1109/ICICDT.2006.220822
Filename :
1669409
Link To Document :
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