Title :
A Self-Tuning Dynamic Voltage Scaled Processor Using Delay-Error Detection and Correction
Author :
Das, Shidhartha ; Roberts, David ; Lee, Seokwoo ; Pant, Sanjay ; Blaauw, David ; Austin, Todd ; Mudge, Trevor ; Flautner, Krisztian
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI
Abstract :
In this paper, we present the implementation and silicon measurements results of a 64bit processor fabricated in 0.18mum technology. The processor employs a delay-error detection and correction scheme called Razor to eliminate voltage safety margins and scale voltage 120mV below the first failure point. It achieves 44% energy savings over the worst case operating conditions for a 0.1% targeted error rate at a fixed frequency of 120MHz
Keywords :
error correction; error detection; microprocessor chips; scaling circuits; 0.18 micron; 64bit processor; Razor; delay-error detection; dynamic voltage scaled processor; error correction; Clocks; Delay; Dynamic voltage scaling; Error analysis; Flip-flops; Frequency; Latches; Metastasis; Silicon; Voltage control;
Conference_Titel :
Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on
Conference_Location :
Padova
Print_ISBN :
1-4244-0097-X
DOI :
10.1109/ICICDT.2006.220829
