• DocumentCode
    2387177
  • Title

    Reducing data transfer latency of NAND flash memory with soft-decision sensing

  • Author

    Dong, Guiqiang ; Zou, Yuelin ; Zhang, Tong

  • Author_Institution
    Comput. & Syst. Eng. Dept., Rensselaer Polytech. Inst. (RPI), Troy, NY, USA
  • fYear
    2012
  • fDate
    10-15 June 2012
  • Firstpage
    7024
  • Lastpage
    7028
  • Abstract
    With the aggressive technology scaling and use of multi-bit per cell storage, NAND flash memory is subject to continuous degradation of raw storage reliability and demands more and more powerful error correction codes (ECC). This inevitable trend makes conventional BCH code increasingly inadequate, and iterative coding solutions such as LDPC codes become very natural alternative options. However, these powerful coding solutions demand soft-decision memory sensing, which results in longer on-chip memory sensing latency and memory-to-controller data transfer latency. This paper presents two simple design techniques that can reduce the memory-to-controller data transfer latency. The key is to appropriately apply entropy coding to compress the memory sensing results. Simulation results show that the proposed design solutions can reduce the data transfer latency by up to 64% for soft-decision memory sensing.
  • Keywords
    BCH codes; NAND circuits; error correction codes; flash memories; parity check codes; BCH code; Bose-Chaudhuri-Hocquenghem codes; ECC; LDPC codes; NAND flash memory; entropy coding; error correction codes; iterative coding solutions; memory-to-controller data transfer latency; multi-bit per cell storage; on-chip memory sensing latency; raw storage reliability; soft-decision memory sensing; soft-decision sensing; Ash; Entropy coding; Error correction codes; Quantization; Sensors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications (ICC), 2012 IEEE International Conference on
  • Conference_Location
    Ottawa, ON
  • ISSN
    1550-3607
  • Print_ISBN
    978-1-4577-2052-9
  • Electronic_ISBN
    1550-3607
  • Type

    conf

  • DOI
    10.1109/ICC.2012.6364887
  • Filename
    6364887