High performance polyvinylidene fluoride films prepared by solid-state coextrusion

Author

Furukawa, T. ; Kano, K. ; Takahashi, Y. ; Nakamura, K. ; Kanamoto, T.

Author_Institution

Fac. of Sci., Tokyo Univ. of Sci., Japan

fYear

2002

fDate

2002

Firstpage

371

Lastpage

374

Abstract

High performance polyvinylidene fluoride films were successfully obtained by solid-state coextrusion of dry gel films to an extrusion draw ratio of 9. They exhibit square D-E hysteresis loops with remanent polarization 100 mC/m². The electromechanical coupling coefficient determined by thickness extensional mode piezoelectric resonance reaches 0.27. These values are 60% greater than those obtained for conventional uniaxially-drawn PVDF films. The electromechanical data taken over a broad temperature range are presented and the factors that achieve high performance are discussed.

Keywords

dielectric hysteresis; dielectric polarisation; extrusion; materials preparation; piezoelectric thin films; polymer films; PVDF films; dry gel films; electromechanical coupling coefficient; high performance polymer films; polyvinylidene fluoride films; remanent polarization; solid-state coextrusion; square D-E hysteresis loops; thickness extensional mode piezoelectric resonance; Crystallization; Dielectric measurements; Frequency; Hysteresis; Piezoelectric films; Resonance; Solid state circuits; Tellurium; Temperature distribution; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on

Print_ISBN

0-7803-7560-2

Type

conf

DOI

10.1109/ISE.2002.1043021

Filename

1043021