DocumentCode
2388250
Title
CMOS Devices - Mobility Enhancement and Characterization
fYear
2006
fDate
11-13 Dec. 2006
Firstpage
1
Lastpage
1
Keywords
CMOS technology; Capacitive sensors; Current measurement; Degradation; Fluid flow measurement; Gallium arsenide; MOSFETs; Paper technology; Scattering; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location
San Francisco, CA
Print_ISBN
1-4244-0438-X
Type
conf
DOI
10.1109/IEDM.2006.346869
Filename
4154288
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