• DocumentCode
    2388504
  • Title

    Study of electron transfer in metal-alkanethiol SAM-metal junctions

  • Author

    Dong, Hao ; Deng, Ning ; Zhang, Lei ; Ren, Min ; Chen, Peiyi

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    254
  • Lastpage
    257
  • Abstract
    As the basis of molecular electronic devices, more attentions have been concentrated on the electron transfer in single-molecule junctions. In present paper, molecular junctions were constructed by using a sandwich structure that consists of metal film/self-assembled monolayers (SAM)/Au coated conducting-probe atomic force microscopy (CP-AFM) tip. The dependence of I-V characteristics on the length of molecules was investigated to explain electron transfer process in saturated molecules such as alkanethiol monolayer. The experiment results show that the molecular conductance decreases with increasing of molecule chain length was found in the sandwich structure
  • Keywords
    atomic force microscopy; electrical conductivity; gold; metallic thin films; molecular electronics; monolayers; organic compounds; rectification; Au; I-V characteristics; conducting-probe atomic force microscopy tip; electron transfer; metal film; metal-alkanethiol SAM-metal junctions; molecular conductance; molecular electronic devices; molecular junctions; molecule chain length; rectification effect; sandwich structure; self-assembled monolayers; Atomic force microscopy; Atomic layer deposition; Conductive films; Electrons; Gold; Metal-insulator structures; Molecular electronics; Sandwich structures; Switches; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology, 2006. IWJT '06. International Workshop on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0047-3
  • Type

    conf

  • DOI
    10.1109/IWJT.2006.220904
  • Filename
    1669491