DocumentCode
2389056
Title
An investigation of the influence of semiconductive electrode materials in the ac breakdown and the charge accumulation in XLPE
Author
Kim, E.J. ; Park, D.H. ; Kim, H.S. ; Lee, G.J.
Author_Institution
Insulating Mater. Technol. Group, LG Cable Central Res. Inst., Kyungki, South Korea
fYear
1998
fDate
25-28 Oct 1998
Firstpage
546
Abstract
A research in semiconductive shields has played an important role in developing an electric power cable. To investigate the influence of semiconductive shield materials on the electrical properties of XLPE insulation in power cable, an ac dielectric strength of XLPE was examined using various semiconductive electrodes. The behaviors of space charges under a dc high voltage in XLPE with semiconductive electrode were also observed by means of pulsed electroacoustic method. Carbon black loaded ethylene ethyl acrylate (EEA) was used as the material of semiconductive electrodes. The electrical property such as a volume resistivity was controlled by changing the type, amounts, or mixing method of crosslinking agent. It is considered that the volume resistivity of semiconductive electrode affects the characteristics of charge accumulations and ac breakdown behaviors in XLPE
Keywords
XLPE insulation; electric breakdown; electric strength; electrical resistivity; electrodes; power cable insulation; space charge; AC breakdown; XLPE insulation; carbon black loaded ethylene ethyl acrylate; charge accumulation; cross-linking agent; dielectric strength; electrical properties; power cable; pulsed electroacoustic method; semiconductive electrode; semiconductive shield; space charge; volume resistivity; Cable insulation; Cable shielding; Conductivity; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Power cables; Semiconductor materials; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1998. Annual Report. Conference on
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-5035-9
Type
conf
DOI
10.1109/CEIDP.1998.732956
Filename
732956
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