• DocumentCode
    2389400
  • Title

    Simulation of Carbon nanotube FETs including hot-phonon and self-heating effects

  • Author

    Hasan, Sayed ; Alam, Muhammad Ashraful ; Lundstrom, Mark

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
  • fYear
    2006
  • fDate
    11-13 Dec. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A comprehensive exploration of how phonon scattering affects carbon nanotube FET is presented in this work. A full band electron and phonon Boltzmann transport equation (BTE) coupled with heat equation is used for the first time to asses the transistor performance. Comparing with measured data for the metallic tube, the importance of hot-phonon effect is shown. The model is then applied to explore these effects in CNT MOSFETs. Under large gate bias, we show that, hot phonon effect reduces the on-current by 33%. From a full dynamic simulation, with idealized isothermal condition, the unity gain cut-off frequency of a 20nm gate length ballistic CNT MOSFET is estimated to be 1.26THz. The estimated cut-off frequency reduces to 550GHz with hot phonon effects. Device heating is also examined. Due to small operating bias (0.5V) and lower current of a single tube, temperature rise of a single tube is negligible
  • Keywords
    Boltzmann equation; carbon nanotubes; field effect transistors; phonons; carbon nanotube FET; full band electron; hot-phonon; phonon Boltzmann transport equation; phonon scattering; self-heating effects; Boltzmann equation; CNTFETs; Cutoff frequency; Electrons; Frequency estimation; Heating; Isothermal processes; MOSFETs; Phonons; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2006. IEDM '06. International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-4244-0438-X
  • Electronic_ISBN
    1-4244-0439-8
  • Type

    conf

  • DOI
    10.1109/IEDM.2006.346738
  • Filename
    4154339