DocumentCode :
2389449
Title :
Nonvolatile ferroelectric polymer memory with controlled hierarchical nanostructures
Author :
Kang, S.J. ; Park, Y.J. ; Park, C.
Author_Institution :
Dept. of Mater. Sci. & Eng., Yonsei Univ., Seoul, South Korea
fYear :
2011
fDate :
28-31 Aug. 2011
Firstpage :
15
Lastpage :
16
Abstract :
In summary, we demonstrated a novel non-volatile ferroelectric polymer transistor memory operating at low voltage with reliable data retention. The nanometer scale periodic trenches of OS lamellae were prepared using block copolymer self assembly and employed as a gate insulator by hybridizing with PVDF-TrFE. Confined crystallization of PVDF-TrFE in the trenches of OS lamellae not only significantly reduces the gate leakage current but also induces effective crystal orientation that facilitates ferroelectric polarization switching. A FeFET consisting of a 1D ribbon type single crystalline TIPS-PEN as an active channel and a hybrid PVDF-TrFE/OS lamellae gate insulator exhibits IDS hysteresis fully that is saturated at a programming voltage as low as ±8 V, ON/OFF current ratio of ~102, and data retention of ~2 hours.
Keywords :
crystallisation; ferroelectric materials; ferroelectric switching; nanostructured materials; polymerisation; random-access storage; self-assembly; block copolymer self assembly; confined crystallization; controlled hierarchical nanostructures; ferroelectric polarization switching; gate insulator; gate leakage current; nonvolatile ferroelectric polymer memory; reliable data retention; Atmospheric measurements; Heating; Logic gates; Particle measurements; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets (ISE), 2011 14th International Symposium on
Conference_Location :
Montpellier
ISSN :
2153-3253
Print_ISBN :
978-1-4577-1023-0
Type :
conf
DOI :
10.1109/ISE.2011.6084959
Filename :
6084959
Link To Document :
بازگشت