• DocumentCode
    2389449
  • Title

    Nonvolatile ferroelectric polymer memory with controlled hierarchical nanostructures

  • Author

    Kang, S.J. ; Park, Y.J. ; Park, C.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    2011
  • fDate
    28-31 Aug. 2011
  • Firstpage
    15
  • Lastpage
    16
  • Abstract
    In summary, we demonstrated a novel non-volatile ferroelectric polymer transistor memory operating at low voltage with reliable data retention. The nanometer scale periodic trenches of OS lamellae were prepared using block copolymer self assembly and employed as a gate insulator by hybridizing with PVDF-TrFE. Confined crystallization of PVDF-TrFE in the trenches of OS lamellae not only significantly reduces the gate leakage current but also induces effective crystal orientation that facilitates ferroelectric polarization switching. A FeFET consisting of a 1D ribbon type single crystalline TIPS-PEN as an active channel and a hybrid PVDF-TrFE/OS lamellae gate insulator exhibits IDS hysteresis fully that is saturated at a programming voltage as low as ±8 V, ON/OFF current ratio of ~102, and data retention of ~2 hours.
  • Keywords
    crystallisation; ferroelectric materials; ferroelectric switching; nanostructured materials; polymerisation; random-access storage; self-assembly; block copolymer self assembly; confined crystallization; controlled hierarchical nanostructures; ferroelectric polarization switching; gate insulator; gate leakage current; nonvolatile ferroelectric polymer memory; reliable data retention; Atmospheric measurements; Heating; Logic gates; Particle measurements; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets (ISE), 2011 14th International Symposium on
  • Conference_Location
    Montpellier
  • ISSN
    2153-3253
  • Print_ISBN
    978-1-4577-1023-0
  • Type

    conf

  • DOI
    10.1109/ISE.2011.6084959
  • Filename
    6084959