DocumentCode
2389449
Title
Nonvolatile ferroelectric polymer memory with controlled hierarchical nanostructures
Author
Kang, S.J. ; Park, Y.J. ; Park, C.
Author_Institution
Dept. of Mater. Sci. & Eng., Yonsei Univ., Seoul, South Korea
fYear
2011
fDate
28-31 Aug. 2011
Firstpage
15
Lastpage
16
Abstract
In summary, we demonstrated a novel non-volatile ferroelectric polymer transistor memory operating at low voltage with reliable data retention. The nanometer scale periodic trenches of OS lamellae were prepared using block copolymer self assembly and employed as a gate insulator by hybridizing with PVDF-TrFE. Confined crystallization of PVDF-TrFE in the trenches of OS lamellae not only significantly reduces the gate leakage current but also induces effective crystal orientation that facilitates ferroelectric polarization switching. A FeFET consisting of a 1D ribbon type single crystalline TIPS-PEN as an active channel and a hybrid PVDF-TrFE/OS lamellae gate insulator exhibits IDS hysteresis fully that is saturated at a programming voltage as low as ±8 V, ON/OFF current ratio of ~102, and data retention of ~2 hours.
Keywords
crystallisation; ferroelectric materials; ferroelectric switching; nanostructured materials; polymerisation; random-access storage; self-assembly; block copolymer self assembly; confined crystallization; controlled hierarchical nanostructures; ferroelectric polarization switching; gate insulator; gate leakage current; nonvolatile ferroelectric polymer memory; reliable data retention; Atmospheric measurements; Heating; Logic gates; Particle measurements; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets (ISE), 2011 14th International Symposium on
Conference_Location
Montpellier
ISSN
2153-3253
Print_ISBN
978-1-4577-1023-0
Type
conf
DOI
10.1109/ISE.2011.6084959
Filename
6084959
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