DocumentCode
2389651
Title
Behind space charge distribution measurements
Author
Hole, S.
Author_Institution
Lab. de Phys. et d´´Etude des Mater., UPMC, Paris, France
fYear
2011
fDate
28-31 Aug. 2011
Firstpage
35
Lastpage
36
Abstract
Measuring space charge seems relatively simple, but the complexity of the sample structure and interfacial conditions may result in biased analysis. In this abstract, some clues are given to test which factor are important to check before analyzing measurements.
Keywords
charge measurement; space charge; interfacial conditions; space charge distribution measurements; Materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets (ISE), 2011 14th International Symposium on
Conference_Location
Montpellier
ISSN
2153-3253
Print_ISBN
978-1-4577-1023-0
Type
conf
DOI
10.1109/ISE.2011.6084969
Filename
6084969
Link To Document