Title :
CMOS Devices - Silicon-on-Insulator and Multi-Gate Devices
Keywords :
Capacitive sensors; FinFETs; Insulation; Leakage current; MOSFETs; Propagation delay; Random access memory; Ring oscillators; Silicon on insulator technology; Transistors;
Conference_Titel :
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0438-X
DOI :
10.1109/IEDM.2006.346921
