• DocumentCode
    2390286
  • Title

    1T-DRAM at the 22nm technology node and beyond: An alternative to DRAM with high-k storage capacitor

  • Author

    Bawedin, M. ; Cristoloveanu, S. ; Hubert, A. ; Guegan, G. ; Chang, S.J. ; Sagnes, B. ; Martinez, F. ; Pascal, F. ; Valenza, M. ; Hoffmann, A.

  • Author_Institution
    IES, Univ. of Montpellier II, Montpellier, France
  • fYear
    2011
  • fDate
    28-31 Aug. 2011
  • Firstpage
    93
  • Lastpage
    94
  • Abstract
    In this work, the authors demonstrate that the meta-stable DRAM (MSDRAM) can achieve better performances regarding to the sensing margin compared to programming methods like impact ionization and forward biased junctions. This improvement results mainly from the low current level at 0-state. Indeed, the MSDRAM uses gate capacitive coupling method which allows to reach zero current level. Finally, the band-to-band tunneling used to program the 1-state strongly reduces the power consumption and improves the device reliability. These promising results promote the meta-stable dip (MSD) programming mechanism as a viable solution for low power single-transistor DRAM memories.
  • Keywords
    DRAM chips; impact ionisation; programming; 1T-DRAM; MSD programming; MSDRAM; band-to-band tunneling; forward biased junction; gate capacitive coupling method; impact ionization; metastable DRAM; metastable dip; single transistor DRAM memory; size 22 nm; zero current level; Logic gates; Rain; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets (ISE), 2011 14th International Symposium on
  • Conference_Location
    Montpellier
  • ISSN
    2153-3253
  • Print_ISBN
    978-1-4577-1023-0
  • Type

    conf

  • DOI
    10.1109/ISE.2011.6084998
  • Filename
    6084998