مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2390523

Title :

Device reliability discussion /group

Author :

Nadir, Blayssa

Author_Institution :

Analog Devices

fYear :

2001

fDate :

2001

Firstpage :

Lastpage :

Keywords :

Drives; Foundries; Hot carriers; Leakage current; Process design; Qualifications; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop Final Report, 2001. 2001 IEEE International

Print_ISBN :

0-7803-7167-4

Type :

conf

DOI :

10.1109/IRWS.2001.993929

Filename :

993929

Link To Document :