DocumentCode

2390523

Title

Device reliability discussion /group

Author

Nadir, Blayssa

Author_Institution

Analog Devices

fYear

2001

fDate

2001

Firstpage

98

Lastpage

98

Keywords

Drives; Foundries; Hot carriers; Leakage current; Process design; Qualifications; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 2001. 2001 IEEE International

Print_ISBN

0-7803-7167-4

Type

conf

DOI

10.1109/IRWS.2001.993929

Filename

993929