• DocumentCode
    2390528
  • Title

    Through silicon vias as enablers for 3D systems

  • Author

    Jung, Erik ; Ostmann, A. ; Ramm, P. ; Wolf, J. ; Toepper, M. ; Wiemer, M.

  • Author_Institution
    Fraunhofer IZM, Berlin
  • fYear
    2008
  • fDate
    9-11 April 2008
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    This special session on 3D TSVpsilas will highlight some of the fabrication processes and used technologies to create vias from the frontside of an active circuit to its backside and potential implementation solutions to form complex systems leveraging these novel possibilities. General techniques for via formation are discussed as well as advanced integration solutions leveraging the power of 3D TSVpsilas.
  • Keywords
    elemental semiconductors; semiconductor industry; silicon; 3D systems; Si; active circuit frontside; complex systems; enablers; through silicon vias; Circuits; Dielectrics and electrical insulation; Filling; Micromechanical devices; Radio frequency; Routing; Semiconductor materials; Silicon; Substrates; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS, 2008. MEMS/MOEMS 2008. Symposium on
  • Conference_Location
    Nice
  • Print_ISBN
    978-2-35500-006-5
  • Type

    conf

  • DOI
    10.1109/DTIP.2008.4752965
  • Filename
    4752965