• DocumentCode
    239086
  • Title

    Accuracy vs. robustness: Bi-criteria optimized ensemble of metamodels

  • Author

    Can Cui ; Wu, Tsai-Fu ; Mengqi Hu ; Weir, Jeffery D. ; Xianghua Chu

  • Author_Institution
    Sch. of Comput., Inf., Decision Syst. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2014
  • fDate
    7-10 Dec. 2014
  • Firstpage
    616
  • Lastpage
    627
  • Abstract
    Simulation has been widely used in modeling engineering systems. A metamodel is a surrogate model used to approximate a computationally expensive simulation model. Extensive research has investigated the performance of different metamodeling techniques in terms of accuracy and/or robustness and concluded no model outperforms others across diverse problem structures. Motivated by this finding, this research proposes a bi-criteria (accuracy and robustness) optimized ensemble framework to optimally identify the contributions from each metamodel (Kriging, Support Vector Regression and Radial Basis Function), where uncertainties are modeled for evaluating robustness. Twenty-eight functions from the literature are tested. It is observed for most problems, a Pareto Frontier is obtained, while for some problems only a single point is obtained. Seven geometrical and statistical metrics are introduced to explore the relationships between the function properties and the ensemble models. It is concluded that the bi-criteria optimized ensembles render not only accurate but also robust metamodels.
  • Keywords
    Pareto distribution; digital simulation; radial basis function networks; regression analysis; support vector machines; Pareto Frontier; geometrical metrics; kriging; metamodeling techniques; modeling engineering systems; radial basis function; statistical metrics; support vector regression; surrogate model; Accuracy; Computational modeling; Optimization; Predictive models; Robustness; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), 2014 Winter
  • Conference_Location
    Savanah, GA
  • Print_ISBN
    978-1-4799-7484-9
  • Type

    conf

  • DOI
    10.1109/WSC.2014.7019926
  • Filename
    7019926