DocumentCode
2390920
Title
An EM-like relaxation operator
Author
Turner, M. ; Hancock, E.R.
Author_Institution
Dept. of Comput. Sci., York Univ., UK
Volume
2
fYear
1996
fDate
25-29 Aug 1996
Firstpage
166
Abstract
Traditional probabilistic relaxation labeling schemes are critically dependent on the availability of salient and reliable measurements for initialisation purposes. Unfortunately such measurements may not be obtainable within the level-by-level processing philosophy under which the schemes operate. In this paper we present a new Bayesian probabilistic relaxation labeling scheme which overcomes this problem. Salient label measurements are made available at multiple levels of abstraction through a succession of fitting operations on the raw data. Measurement reliability is achieved by feeding the current label probabilities into fitting operations, thereby facilitating the suppression of noise or outliers. By iterating between fitting and labeling modes in a manner analogous to the EM algorithm, improved robust estimation leads, via more reliable measurements, to better labeling and vice versa. At convergence, both the parametric and symbolic image descriptions are compatible. In this way we offer a compromise between conventional relaxation schemes that are either dominated by the prior label model or that rely on static measurement based compatibility relations. We demonstrate the utility of our evidence-combining scheme in relation to the extraction of differential structure from range data
Keywords
Bayes methods; image reconstruction; image representation; iterative methods; parameter estimation; probability; Bayesian probabilistic relaxation labeling scheme; EM-like relaxation operator; evidence-combining scheme; fitting operations; level-by-level processing philosophy; measurement reliability; noise suppression; outliers suppression; parametric image descriptions; symbolic image descriptions; Availability; Bayesian methods; Computer science; Computer vision; Convergence; Data mining; Filtering; Labeling; Noise measurement; Noise robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location
Vienna
ISSN
1051-4651
Print_ISBN
0-8186-7282-X
Type
conf
DOI
10.1109/ICPR.1996.546745
Filename
546745
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