• DocumentCode
    2390980
  • Title

    S-pad implementation; total plastic package crack solution for non-moisture sensitive package

  • Author

    Umehara, Norito ; Inomata, Shigeji ; Umeda, Yoshikatsu ; Naeshiru, M. ; Sakamoto, Kunio

  • Author_Institution
    New Package Dev., Texas Instruments Japan Ltd., Oita, Japan
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    470
  • Lastpage
    477
  • Abstract
    This paper investigates capability of following technologies; mold compound, die attach adhesive, textured die pad, and buffer coat, in resolving or improving the package crack performance of plastic package during reflow soldering process. We have finally succeeded in resolving this problem by making a die pad smaller than chip size and analyzed the stress, thermal and electrical characterization by using the simulation to determine suitable scoop size and lead frame line-up. The chip size limitation was confirmed by actual experiments for a chip size, a package size and a package thickness
  • Keywords
    cracks; integrated circuit packaging; plastic packaging; reflow soldering; S-pad implementation; buffer coat; chip size limitation; crack performance; die attach adhesive; electrical characterization; lead frame line-up; mold compound; nonmoisture sensitive package; package thickness; plastic package; reflow soldering process; scoop size; stress characterization; textured die pad; thermal characterization; Absorption; Analytical models; Delamination; Microassembly; Moisture; Plastic packaging; Reflow soldering; Resins; Surface-mount technology; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.515323
  • Filename
    515323