DocumentCode
2390980
Title
S-pad implementation; total plastic package crack solution for non-moisture sensitive package
Author
Umehara, Norito ; Inomata, Shigeji ; Umeda, Yoshikatsu ; Naeshiru, M. ; Sakamoto, Kunio
Author_Institution
New Package Dev., Texas Instruments Japan Ltd., Oita, Japan
fYear
1995
fDate
21-24 May 1995
Firstpage
470
Lastpage
477
Abstract
This paper investigates capability of following technologies; mold compound, die attach adhesive, textured die pad, and buffer coat, in resolving or improving the package crack performance of plastic package during reflow soldering process. We have finally succeeded in resolving this problem by making a die pad smaller than chip size and analyzed the stress, thermal and electrical characterization by using the simulation to determine suitable scoop size and lead frame line-up. The chip size limitation was confirmed by actual experiments for a chip size, a package size and a package thickness
Keywords
cracks; integrated circuit packaging; plastic packaging; reflow soldering; S-pad implementation; buffer coat; chip size limitation; crack performance; die attach adhesive; electrical characterization; lead frame line-up; mold compound; nonmoisture sensitive package; package thickness; plastic package; reflow soldering process; scoop size; stress characterization; textured die pad; thermal characterization; Absorption; Analytical models; Delamination; Microassembly; Moisture; Plastic packaging; Reflow soldering; Resins; Surface-mount technology; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.515323
Filename
515323
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