DocumentCode :
2390980
Title :
S-pad implementation; total plastic package crack solution for non-moisture sensitive package
Author :
Umehara, Norito ; Inomata, Shigeji ; Umeda, Yoshikatsu ; Naeshiru, M. ; Sakamoto, Kunio
Author_Institution :
New Package Dev., Texas Instruments Japan Ltd., Oita, Japan
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
470
Lastpage :
477
Abstract :
This paper investigates capability of following technologies; mold compound, die attach adhesive, textured die pad, and buffer coat, in resolving or improving the package crack performance of plastic package during reflow soldering process. We have finally succeeded in resolving this problem by making a die pad smaller than chip size and analyzed the stress, thermal and electrical characterization by using the simulation to determine suitable scoop size and lead frame line-up. The chip size limitation was confirmed by actual experiments for a chip size, a package size and a package thickness
Keywords :
cracks; integrated circuit packaging; plastic packaging; reflow soldering; S-pad implementation; buffer coat; chip size limitation; crack performance; die attach adhesive; electrical characterization; lead frame line-up; mold compound; nonmoisture sensitive package; package thickness; plastic package; reflow soldering process; scoop size; stress characterization; textured die pad; thermal characterization; Absorption; Analytical models; Delamination; Microassembly; Moisture; Plastic packaging; Reflow soldering; Resins; Surface-mount technology; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.515323
Filename :
515323
Link To Document :
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