Wideband microwave pulsed reflectometer using a six-port junction

Author

Demers, Yves ; Bosisio, Renato G. ; Ghannouchi, Fadhel M.

Author_Institution

Microwave Res. Lab., Ecole Polytech. de Montreal, Que., Canada

fYear

1989

fDate

25-27 Apr 1989

Firstpage

529

Lastpage

532

Abstract

A six-port reflectometer technique is extended to make pulsed-RF measurements. It is shown that a time resolution of the order of 1 μs is possible in both repetitive and single-shot mode of operation. A proof of principle of the method is obtained using passive and active loads. A simple method for the linearization of diode detector response is also presented. Because of its good time resolution, the proposed technique can be used to study thermal effects in high-power solid-state amplifiers or to characterize pulse devices used in phased-array radars

Keywords

electronic equipment testing; microwave detectors; microwave reflectometry; network analysers; pulse circuits; reflectometers; test equipment; active loads; diode detector response; high-power solid-state amplifiers; linearization; network analyser; passive loads; phased-array radars; pulse devices; pulsed-RF measurements; repetitive operation; single-shot mode; six-port junction; thermal effects; time resolution; wideband microwave pulsed reflectometer; Diodes; Electromagnetic heating; Envelope detectors; Hardware; Laboratories; Power measurement; Pulse measurements; Reflection; Time measurement; Wideband;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1989. IMTC-89. Conference Record., 6th IEEE

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/IMTC.1989.36916

Filename

36916