• DocumentCode
    2391323
  • Title

    Performance modeling of the interconnect structure of a 3-dimensionally integrated RISC-processor/cache-system

  • Author

    Kühn, Stefan A. ; Kleiner, Michael B. ; Weber, Werner

  • Author_Institution
    Corp. Res. & Dev., Siemens AG, Munich, Germany
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    592
  • Lastpage
    599
  • Abstract
    In order to investigate the performance potential of 3-dimensionally integrated circuits for high performance computer systems a comparative study of the interconnect structure of a RISC-processor/cache system conducted. The impact of electrical parameters of interconnection lines as well as associated package parasitics on second level cache read access is investigated for 3-dimensionally integrated circuit structures and compared to conventional PCBand advanced MCM-realizations of the system. Wiring dimensions and line drivers are optimized for the different packaging technologies and optimal realizations are compared with respect to cache access time and power dissipation. Case studies show reductions of effective switching capacitances of more than an order of magnitude and reductions of second level cache access time of over 40% for optimized 3D-systems compared to conventional PCB-realizations
  • Keywords
    cache storage; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; microprocessor chips; multiprocessor interconnection networks; reduced instruction set computing; RISC processor; access time; cache system; computer system; electrical parameters; interconnection lines; line drivers; package parasitics; performance modeling; power dissipation; switching capacitance; three-dimensional integrated circuits; wiring optimization; Bandwidth; Capacitance; High performance computing; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Metallization; Multichip modules; Three-dimensional integrated circuits; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.515343
  • Filename
    515343