DocumentCode
2391323
Title
Performance modeling of the interconnect structure of a 3-dimensionally integrated RISC-processor/cache-system
Author
Kühn, Stefan A. ; Kleiner, Michael B. ; Weber, Werner
Author_Institution
Corp. Res. & Dev., Siemens AG, Munich, Germany
fYear
1995
fDate
21-24 May 1995
Firstpage
592
Lastpage
599
Abstract
In order to investigate the performance potential of 3-dimensionally integrated circuits for high performance computer systems a comparative study of the interconnect structure of a RISC-processor/cache system conducted. The impact of electrical parameters of interconnection lines as well as associated package parasitics on second level cache read access is investigated for 3-dimensionally integrated circuit structures and compared to conventional PCBand advanced MCM-realizations of the system. Wiring dimensions and line drivers are optimized for the different packaging technologies and optimal realizations are compared with respect to cache access time and power dissipation. Case studies show reductions of effective switching capacitances of more than an order of magnitude and reductions of second level cache access time of over 40% for optimized 3D-systems compared to conventional PCB-realizations
Keywords
cache storage; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; microprocessor chips; multiprocessor interconnection networks; reduced instruction set computing; RISC processor; access time; cache system; computer system; electrical parameters; interconnection lines; line drivers; package parasitics; performance modeling; power dissipation; switching capacitance; three-dimensional integrated circuits; wiring optimization; Bandwidth; Capacitance; High performance computing; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Metallization; Multichip modules; Three-dimensional integrated circuits; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.515343
Filename
515343
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