Title :
Interferometric cross check of two recommended wavelength standards at 633 nm and 657 nm
Author :
Bonsch, G. ; Nicolaus, A. ; Darnedde, H. ; Riehle, F. ; Trebst, T. ; Zinner, G.
Author_Institution :
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
The wavelength standards at 633 nm and 657 nm in the visible part of the spectrum are characterized by most accurate frequency values obtained by frequency chain measurements. A cross check has been performed by an interferometric wavelength comparison and agreement was found within 3.8/spl middot/10/sup -11/ which demonstrates the applicability of both methods for a consistent wavelength scale.
Keywords :
frequency measurement; gas lasers; laser frequency stability; light interferometry; measurement errors; measurement standards; 633 nm; 657 nm; Michelson interferometer; broadband method; consistent wavelength scale; frequency chain measurements; interferometric cross check; interferometric wavelength comparison; metre definition; systematic uncertainties; visible spectrum; wavelength standards; Atomic beams; Atomic measurements; Frequency measurement; Interference; Laser stability; Measurement standards; Mirrors; Optical fiber polarization; Optical interferometry; Wavelength measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546771
