Interferometric cross check of two recommended wavelength standards at 633 nm and 657 nm

Author

Bonsch, G. ; Nicolaus, A. ; Darnedde, H. ; Riehle, F. ; Trebst, T. ; Zinner, G.

Author_Institution

Physikalisch Tech. Bundesanstalt, Braunschweig, Germany

fYear

1996

fDate

17-21 June 1996

Firstpage

195

Lastpage

196

Abstract

The wavelength standards at 633 nm and 657 nm in the visible part of the spectrum are characterized by most accurate frequency values obtained by frequency chain measurements. A cross check has been performed by an interferometric wavelength comparison and agreement was found within 3.8/spl middot/10/sup -11/ which demonstrates the applicability of both methods for a consistent wavelength scale.

Keywords

frequency measurement; gas lasers; laser frequency stability; light interferometry; measurement errors; measurement standards; 633 nm; 657 nm; Michelson interferometer; broadband method; consistent wavelength scale; frequency chain measurements; interferometric cross check; interferometric wavelength comparison; metre definition; systematic uncertainties; visible spectrum; wavelength standards; Atomic beams; Atomic measurements; Frequency measurement; Interference; Laser stability; Measurement standards; Mirrors; Optical fiber polarization; Optical interferometry; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1996 Conference on

Conference_Location

Braunschweig, Germany

Print_ISBN

0-7803-3376-4

Type

conf

DOI

10.1109/CPEM.1996.546771

Filename

546771