Title :
A computer-aided approach for optimal statistical design
Author :
Shen, Y. ; Chen, R.M.M.
Author_Institution :
Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
Abstract :
An approach for design centering and tolerancing to achieve 100% yield is introduced. The procedure consists of steps solving three optimization problems: first, centering the design point to the vicinity of the optimum point in the design parameter space, second, solving a fixed tolerance problem, and third, solving a variable tolerance problem, in which parameter tolerances are reassigned to achieve 10% yield and minimum cost. Two numerical examples testing the approach are presented
Keywords :
circuit CAD; circuit optimisation; optimisation; statistical analysis; computer-aided approach; design centering; design parameter space; design point; fixed tolerance problem; numerical examples; optimal statistical design; optimization problems; tolerancing; Circuits; Cities and towns; Constraint optimization; Costs; Design engineering; Design optimization; Optimization methods; Polynomials; Testing; Yield estimation;
Conference_Titel :
TENCON '94. IEEE Region 10's Ninth Annual International Conference. Theme: Frontiers of Computer Technology. Proceedings of 1994
Print_ISBN :
0-7803-1862-5
DOI :
10.1109/TENCON.1994.369175
