• DocumentCode
    2391523
  • Title

    Performance of TI high density interconnect for 1 GHz digital MCM applications

  • Author

    Kacines, Jeffery J. ; Schaefer, Tim M. ; Gilbert, Barry K.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    669
  • Lastpage
    673
  • Abstract
    Multichip modules have inherent performance advantages over other packaging technologies to which digital designers are turning to meet stringent system performance requirements. However, for designs requiring up to 1 GHz clocks and subnanosecond rise times, a thorough understanding of the multichip module interconnect is essential to fully utilize performance advantages. At these operating speeds, interconnect as Short as one inch can limit system performance in a poorly designed module. This paper presents preliminary data from a joint effort between Texas Instruments (TI) and the Mayo Foundation under sponsorship of the Advanced Research Projects Agency (ARPA) which is characterizing the HDI process for use in high speed designs. Results indicate that HDI technology is well suited for use in digital designs that have clock frequencies as high as one gigahertz and subnanosecond rise times with acceptable noise and signal degradation
  • Keywords
    crosstalk; digital integrated circuits; integrated circuit interconnections; integrated circuit testing; multichip modules; 1 GHz; ARPA; Advanced Research Projects Agency; GHz clock rate; HDI technology; MCM interconnect; Mayo Foundation; Texas Instruments; digital MCM applications; gigahertz clock frequency; high density interconnect; high speed designs; multichip modules; packaging technology; subnanosecond rise times; Clocks; Crosstalk; Electrical resistance measurement; Frequency measurement; Instruments; Microstrip; Stripline; System performance; Testing; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.515354
  • Filename
    515354