Lumped-element sections for modeling coupling between high-speed digital and I/O lines

Author

Cui, W. ; Shi, H. ; Luo, X. ; Sha, F. ; Drewniak, J.L. ; Van Doren, T.P. ; Anderson, T.

Author_Institution

Electromagnetic Compatibility Lab., Missouri Univ., Rolla, MO, USA

fYear

1997

fDate

18-22 Aug 1997

Firstpage

260

Lastpage

265

Abstract

Lumped-element sections are used for modeling coupling between high-speed digital and I/O lines on printed circuit boards (PCBs) in this paper. Radiated electromagnetic interference (EMI) is investigated when the I/O line going off the board is driven as an unintentional, but effective antenna. Simulated results are compared with measurements for coupled lines. A suitable number of lumped-element sections for modeling is chosen based on the line length and the highest frequency of interest

Keywords

electromagnetic interference; lumped parameter networks; printed circuits; transmission line theory; I/O lines; PCB; antenna; coupling modeling; high-speed digital lines; lumped-element sections; printed circuit boards; radiated EMI; radiated electromagnetic interference; Cables; Circuit simulation; Clocks; Coupling circuits; Distributed parameter circuits; Electromagnetic compatibility; Electromagnetic interference; Frequency; Impedance; Resonance;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on

Conference_Location

Austin, TX

Print_ISBN

0-7803-4140-6

Type

conf

DOI

10.1109/ISEMC.1997.667685

Filename

667685