Title :
A generic method for embedded measurement and compensation of process and temperature variations in SOCs
Author :
Bui, Hung Tien ; Savaria, Yvon
Author_Institution :
Ecole Polytechnique de Montreal, Que., Canada
Abstract :
This paper proposes an embedded method of measuring process and temperature variations using the resulting change in transconductance of affected transistors. It also presents a compensation scheme for these variations using a generic and versatile method that can conveniently be used in system-on-chip applications. The measuring and compensating system has been applied on a 9-stage current-controlled oscillator. Differences in oscillating frequency between corner cases have been reduced from over 90 MHz to less than 10 MHz.
Keywords :
system-on-chip; compensating system; current controlled oscillator; embedded measurement; process variations; system-on-chip; temperature variations; transconductance; Current measurement; Equations; Geometry; Integrated circuit measurements; MOSFETs; Oscillators; System-on-a-chip; Temperature measurement; Temperature sensors; Transconductance;
Conference_Titel :
System-on-Chip for Real-Time Applications, 2005. Proceedings. Fifth International Workshop on
Print_ISBN :
0-7695-2403-6
DOI :
10.1109/IWSOC.2005.9
