Title :
The poling field and drawing dependence of the structure of piezoelectric poly(vinylidene fluoride) F2-ME films: IR and X-ray studies
Author :
Gorokhov, A.V. ; Zakrzhevskij, Vladimir I.
Author_Institution :
Dept. of Dielectr. & Semiconductors, Electrotech, Inst., Leningrad, USSR
Abstract :
IR (infrared)-transmission spectra as dependent on poling field and drawing in PVDF (F2-ME) corona poled films was recorded in the 400-4000 cm-1 range with a diffraction spectrometer and in the 20-600 cm-1 range with a Fourier spectrometer. Libration mode absorption bands at 67 and 58 cm-1 due to TTT and TGTG-conformations may be used for estimation of β- and α-phase contents, respectively X-ray diffraction spectra for the radiation direction coincided with the drawing direction of multilayered specimens showing 001 β and 002 α reflections. The drawing ratio dependence of the piezoelectric coefficient d31 exhibited a maximum attributed to β-phase→amorphous phase transformation at large drawing ratios
Keywords :
X-ray diffraction examination of materials; dielectric polarisation; electrets; infrared spectra of organic molecules and substances; piezoelectric materials; polymer films; polymer structure; 20 to 600 cm-1; 400 to 4000 cm-1; Fourier spectrometer; PVDF (F2-ME); X-ray diffraction spectra; diffraction spectrometer; drawing dependence; drawing ratio dependence; electret; piezoelectric coefficient; piezoelectric poly(vinylidene fluoride); poling field; structure; Absorption; Amorphous materials; Corona; Manufacturing processes; Optical films; Phase estimation; Piezoelectric films; Piezoelectric polarization; Spectroscopy; X-ray diffraction;
Conference_Titel :
Electrets, 1991. (ISE 7) Proceedings., 7th International Symposium on (Cat. No.91CH3029-6)
Conference_Location :
Berlin
Print_ISBN :
0-7803-0112-9
DOI :
10.1109/ISE.1991.167253
