The poling field and drawing dependence of the structure of piezoelectric poly(vinylidene fluoride) F2-ME films: IR and X-ray studies

Author

Gorokhov, A.V. ; Zakrzhevskij, Vladimir I.

Author_Institution

Dept. of Dielectr. & Semiconductors, Electrotech, Inst., Leningrad, USSR

fYear

1991

fDate

25-27 Sep 1991

Firstpage

444

Lastpage

448

Abstract

IR (infrared)-transmission spectra as dependent on poling field and drawing in PVDF (F2-ME) corona poled films was recorded in the 400-4000 cm^-1 range with a diffraction spectrometer and in the 20-600 cm^-1 range with a Fourier spectrometer. Libration mode absorption bands at 67 and 58 cm^-1 due to TTT and TGTG-conformations may be used for estimation of β- and α-phase contents, respectively X-ray diffraction spectra for the radiation direction coincided with the drawing direction of multilayered specimens showing 001 β and 002 α reflections. The drawing ratio dependence of the piezoelectric coefficient d₃₁ exhibited a maximum attributed to β-phase→amorphous phase transformation at large drawing ratios

Keywords

X-ray diffraction examination of materials; dielectric polarisation; electrets; infrared spectra of organic molecules and substances; piezoelectric materials; polymer films; polymer structure; 20 to 600 cm^-1; 400 to 4000 cm^-1; Fourier spectrometer; PVDF (F2-ME); X-ray diffraction spectra; diffraction spectrometer; drawing dependence; drawing ratio dependence; electret; piezoelectric coefficient; piezoelectric poly(vinylidene fluoride); poling field; structure; Absorption; Amorphous materials; Corona; Manufacturing processes; Optical films; Phase estimation; Piezoelectric films; Piezoelectric polarization; Spectroscopy; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1991. (ISE 7) Proceedings., 7th International Symposium on (Cat. No.91CH3029-6)

Conference_Location

Berlin

Print_ISBN

0-7803-0112-9

Type

conf

DOI

10.1109/ISE.1991.167253

Filename

167253