Title :
An improved sine wave fitting procedure for characterizing data acquisition channels
Author :
Pintelon, R. ; Schoukens, J.
Abstract :
This paper presents a new sine wave fitting procedure for characterizing data acquisition channels and analog-to-digital converters. It overcomes most of the problems encountered with the classical 3 or 4 parameter sine wave fitting procedure described in the IEEE Standard 1057. The stochastic properties of the new procedure are thoroughly analyzed. Its performance is illustrated by simulations and measurements with a high frequency sampling scope
Keywords :
Analog-digital conversion; Data acquisition; Fitting; Frequency estimation; Frequency measurement; Phase measurement; Sampling methods; Signal processing; Stochastic processes; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1995. IMTC/95. Proceedings. Integrating Intelligent Instrumentation and Control., IEEE
Conference_Location :
Waltham, MA, USA
Print_ISBN :
0-7803-2615-6
DOI :
10.1109/IMTC.1995.515407
