DocumentCode :
2392913
Title :
FPgen - a test generation framework for datapath floating-point verification
Author :
Aharoni, Merav ; Asaf, Sigal ; Fournier, L. ; Koifman, Anatoly ; Nagel, Raviv
Author_Institution :
IBM Haifa Res. Labs., Israel
fYear :
2003
fDate :
12-14 Nov. 2003
Firstpage :
17
Lastpage :
22
Abstract :
FPgen is a new test generation framework targeted toward the verification of the floating point (FP) datapath, through the generation of test cases. This framework provides the capacity to define virtually any architectural FP coverage model, consisting of verification tasks. The tool supplies strong constraint solving capabilities, allowing the generation of random tests that target these tasks. We present an overview of FPgen´s functionality, describe the results of its use for the verification of several FP units, and compare its efficiency with existing test generators.
Keywords :
automatic test pattern generation; constraint handling; floating point arithmetic; high level synthesis; software tools; FPgen a test generation framework; architectural coverage model; constraint solving capabilities; data constraints; datapath floating-point verification; high level description; random tests; simulation-based verification; verification tasks; Computer bugs; Debugging; Formal verification; Investments; Manuals; Microprocessors; Power generation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-8236-6
Type :
conf
DOI :
10.1109/HLDVT.2003.1252469
Filename :
1252469
Link To Document :
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