• DocumentCode
    2393050
  • Title

    Relating vehicle-level and network-level reliability through high-level fault injection

  • Author

    Corno, Fulvio ; Gabrielli, P. ; Tosato, S.

  • Author_Institution
    Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
  • fYear
    2003
  • fDate
    12-14 Nov. 2003
  • Firstpage
    71
  • Lastpage
    76
  • Abstract
    This paper presents some recent results to improve the evaluation of reliability due to network connections in automotive environments. Evaluation is based on the adoption of performance thresholds aiming at detecting performance loss at particular types of fault occurrence. For this activity we modeled the vehicle network at the functional level and then integrated it into a complete vehicle model describing both electronic and mechanical behavior; in this way, it is possible to build an automated fault injection environment to forecast the effects of faults at the network level on the vehicle dynamics. Furthermore, an on-line threshold manager permits to interrupt a single simulation when a fault activates an error threshold, reducing the overall campaign simulation time.
  • Keywords
    automotive electronics; computer network reliability; controller area networks; fault currents; fault tolerance; intelligent control; vehicle dynamics; automated fault injection environment; automotive environments; error threshold; fault occurrence; high-level fault injection; intelligent control units; network connections; network-level reliability; on-line threshold manager; performance thresholds; vehicle dynamics; vehicle-level reliability; worst-case situations; Automatic control; Automotive engineering; Control systems; Delay effects; Performance loss; Predictive models; Reliability engineering; Telecommunication network reliability; Vehicle dynamics; Vehicle safety;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-8236-6
  • Type

    conf

  • DOI
    10.1109/HLDVT.2003.1252477
  • Filename
    1252477