• DocumentCode
    2393076
  • Title

    Verifying LOC based functional and performance constraints

  • Author

    Chen, Xi ; Hsieh, Harry ; Balarin, Felice ; Watanabe, Yosinori

  • Author_Institution
    California Univ., Riverside, CA, USA
  • fYear
    2003
  • fDate
    12-14 Nov. 2003
  • Firstpage
    83
  • Lastpage
    88
  • Abstract
    In the era of billion-transistor design, it is critical to establish effective verification methodologies from the system level all the way down to the implementations. Assertion languages (e.g. IBM´s Sugar2.0, Synopsys´s OpenVera) have gained wide acceptance for specifying functional properties for automatic validation. They are, however, based on linear temporal logic (LTL), and hence have certain limitations. Logic of constraints (LOC) was introduced for specifying quantitative performance constraints, and is particularly suitable for automatic transaction level analysis. We analyze LTL and LOC, and show that they have different domains of expressiveness. Using both LTL and LOC can make the verification process more effective in the context of simulation assertion checking as well as formal verification. Through industrial case studies, we demonstrate the usefulness of this verification methodology.
  • Keywords
    constraint handling; formal verification; logic design; logic simulation; temporal logic; LOC; LOC based functional constraints; LOC based performance constraints; LTL; automatic transaction level analysis; automatic validation; formal verification; linear temporal logic; logic of constraints; model checking; simulation assertion checking; simulation trace analysis; system level verification; Analytical models; Context modeling; Ear; Formal verification; Hardware design languages; Lab-on-a-chip; Laboratories; Logic; Specification languages; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-8236-6
  • Type

    conf

  • DOI
    10.1109/HLDVT.2003.1252479
  • Filename
    1252479