Title :
Enhancing the control and efficiency of the covering process [logic verification]
Author :
Fine, Shai ; Ziv, Avi
Author_Institution :
IBM Res. Lab in Haifa, Haifa Univ. Campus, Israel
Abstract :
Coverage directed test generation (CDG) is a technique for providing feedback from the coverage domain back to a generator that produces new stimuli to the tested design. In this paper, we describe two algorithms that act in a CDG framework. The first algorithm controls the coverage events distribution using a "water-filling" approach. The second algorithm improves the efficiency of the covering process using clustering techniques.
Keywords :
automatic test pattern generation; belief networks; feedback; formal verification; logic design; logic simulation; logic testing; Bayesian network; CDG framework; clustering techniques; coverage directed test generation; coverage domain feedback; coverage events distribution; feedback-based verification process; functional verification; logic verification; random test generators; simulation based verification techniques; tested design stimuli; water-filling technique; Automatic testing; Bayesian methods; Clustering algorithms; Engines; Event detection; Feedback; Hardware; Random number generation;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-8236-6
DOI :
10.1109/HLDVT.2003.1252481
