Title :
Yield-award placement optimization for Switched-Capacitor analog integrated circuits
Author :
Huang, Chien-Chih ; Chen, Jwu-E ; Luo, Pei-Wen ; Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Abstract :
Paralleling square unit capacitors have been commonly used for Switched-Capacitor circuits to achieve higher accurate capacitor ratio. However, the capacitor ratio may be shifted due to the wire interconnection of these unit capacitors. The small capacitor ratio shift may cause a significant yield drop. The ratio shift can be reduced by using extra circuitry to achieve parasitic insensitive design. This study presents a simple a layout modification to alleviate the ratio shift, thus enhancing yield, without requiring extra circuitry.
Keywords :
analogue integrated circuits; circuit layout; integrated circuit interconnections; optimisation; switched capacitor networks; capacitor ratio; layout modification; paralleling square unit capacitors; switched-capacitor analog integrated circuits; wire interconnection; yield-award placement optimization; Capacitors; Correlation; Layout; Optimization; Parasitic capacitance; Wires; Yield-Award; layout generator; physical realization; random variation; spatial correlation;
Conference_Titel :
SOC Conference (SOCC), 2011 IEEE International
Conference_Location :
Taipei
Print_ISBN :
978-1-4577-1616-4
Electronic_ISBN :
2164-1676
DOI :
10.1109/SOCC.2011.6085127