• DocumentCode
    2393172
  • Title

    ATPG-based preimage computation: efficient search space pruning with ZBDD

  • Author

    Chandrasekar, Kameshwar ; Hsiao, Michael S.

  • Author_Institution
    Virginia Tech, Blacksburg, VA, USA
  • fYear
    2003
  • fDate
    12-14 Nov. 2003
  • Firstpage
    117
  • Lastpage
    122
  • Abstract
    Computing image/preimage is a fundamental step in formal verification of hardware systems. Conventional OBDD-based methods for formal verification suffer from spatial explosion, since OBDDs can grow exponentially in large designs. On the other hand, SAT/ATPG based methods are less demanding on memory. But the run-time can be huge for these methods, since they must explore an exponential search space. In order to reduce this temporal explosion of SAT/ATPG based methods, efficient learning techniques are needed. In this paper, we present a new ZBDD based method to compactly store and efficiently search previously explored search-states for ´ATPG-based preimage computation´. We learn front these search-states and avoid searching their subsets or supersets. Both,solution and conflict subspaces are pruned based on simple set operations using ZBDDs. We integrate our techniques into an ATPG engine and demonstrate their efficiency on ISCAS ´89 benchmark circuits. Experimental results show that significant search-space pruning for preimage computation is achieved, compared to previous methods.
  • Keywords
    automatic test pattern generation; binary decision diagrams; computability; formal verification; high level synthesis; sequential circuits; ATPG-based preimage computation; PODEM algorithm; VLSI CAD; ZBDD based method; benchmark circuits; conflict subspaces; efficient learning techniques; efficient search space pruning; formal verification; partially-equivalent search-states; Automatic test pattern generation; Binary decision diagrams; Circuits; Decision trees; Engines; Explosions; Formal verification; Hardware; Runtime; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-8236-6
  • Type

    conf

  • DOI
    10.1109/HLDVT.2003.1252484
  • Filename
    1252484