DocumentCode
2393172
Title
ATPG-based preimage computation: efficient search space pruning with ZBDD
Author
Chandrasekar, Kameshwar ; Hsiao, Michael S.
Author_Institution
Virginia Tech, Blacksburg, VA, USA
fYear
2003
fDate
12-14 Nov. 2003
Firstpage
117
Lastpage
122
Abstract
Computing image/preimage is a fundamental step in formal verification of hardware systems. Conventional OBDD-based methods for formal verification suffer from spatial explosion, since OBDDs can grow exponentially in large designs. On the other hand, SAT/ATPG based methods are less demanding on memory. But the run-time can be huge for these methods, since they must explore an exponential search space. In order to reduce this temporal explosion of SAT/ATPG based methods, efficient learning techniques are needed. In this paper, we present a new ZBDD based method to compactly store and efficiently search previously explored search-states for ´ATPG-based preimage computation´. We learn front these search-states and avoid searching their subsets or supersets. Both,solution and conflict subspaces are pruned based on simple set operations using ZBDDs. We integrate our techniques into an ATPG engine and demonstrate their efficiency on ISCAS ´89 benchmark circuits. Experimental results show that significant search-space pruning for preimage computation is achieved, compared to previous methods.
Keywords
automatic test pattern generation; binary decision diagrams; computability; formal verification; high level synthesis; sequential circuits; ATPG-based preimage computation; PODEM algorithm; VLSI CAD; ZBDD based method; benchmark circuits; conflict subspaces; efficient learning techniques; efficient search space pruning; formal verification; partially-equivalent search-states; Automatic test pattern generation; Binary decision diagrams; Circuits; Decision trees; Engines; Explosions; Formal verification; Hardware; Runtime; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-8236-6
Type
conf
DOI
10.1109/HLDVT.2003.1252484
Filename
1252484
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