“Introduction to SoC testing”

Continued advances in manufacturing technology have enabled an SoC design to contain billions of transistors. The increase of circuit complexity has imposed serious challenges on product quality, test cost, and system reliability. In this talk, I will give a brief introduction to SoC testing of digital circuits. Test techniques that have been practiced in industry to improve product quality and test cost are first described. A few emerging techniques to further reduce product development time and increase system reliability are then discussed.