• DocumentCode
    239458
  • Title

    Automated planning and creation of simulation experiments with a domain specific ontology for semiconductor manufacturing AMHS

  • Author

    Wagner, Thomas ; Gellrich, Andre ; Schwenke, Clemens ; Kabitzsch, Klaus ; Schneider, Germar

  • Author_Institution
    Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2014
  • fDate
    7-10 Dec. 2014
  • Firstpage
    2628
  • Lastpage
    2639
  • Abstract
    To successfully manufacture logic and power semiconductors in existing high mix semiconductor factories, fast ramp up phases and frequent product changes are necessary. Especially for power semiconductor production, new manufacturing and automation concepts are required, e.g. regarding the use of other substrates than silicon wafers. To allow a judgment on how an existing automated material handling system (AMHS) can cope with the new challenges or which alterations are required, a material flow simulation is essential. However, the planning and creation of such simulation experiments is difficult because of the systems complexity, the large amount of boundary conditions and the effort of manually modifying and testing many different variants, partially using currently unforeseen automation concepts. In order to assist in this process, the authors suggest a method for rapidly creating valid simulation experiments using an ontology that allows for the reuse of previous experiments and system experts knowledge.
  • Keywords
    computational complexity; factory automation; materials handling equipment; ontologies (artificial intelligence); planning; production engineering computing; semiconductor device manufacture; automated material handling system; automated planning; automation concepts; domain specific ontology; high mix semiconductor factories; logic semiconductors; material flow simulation; power semiconductors; product changes; ramp up phases; semiconductor manufacturing AMHS; silicon wafers; simulation experiments; system experts knowledge; systems complexity; Adaptation models; Analytical models; Knowledge based systems; Manufacturing; Ontologies; Production; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), 2014 Winter
  • Conference_Location
    Savanah, GA
  • Print_ISBN
    978-1-4799-7484-9
  • Type

    conf

  • DOI
    10.1109/WSC.2014.7020107
  • Filename
    7020107