DocumentCode
239458
Title
Automated planning and creation of simulation experiments with a domain specific ontology for semiconductor manufacturing AMHS
Author
Wagner, Thomas ; Gellrich, Andre ; Schwenke, Clemens ; Kabitzsch, Klaus ; Schneider, Germar
Author_Institution
Tech. Univ. Dresden, Dresden, Germany
fYear
2014
fDate
7-10 Dec. 2014
Firstpage
2628
Lastpage
2639
Abstract
To successfully manufacture logic and power semiconductors in existing high mix semiconductor factories, fast ramp up phases and frequent product changes are necessary. Especially for power semiconductor production, new manufacturing and automation concepts are required, e.g. regarding the use of other substrates than silicon wafers. To allow a judgment on how an existing automated material handling system (AMHS) can cope with the new challenges or which alterations are required, a material flow simulation is essential. However, the planning and creation of such simulation experiments is difficult because of the systems complexity, the large amount of boundary conditions and the effort of manually modifying and testing many different variants, partially using currently unforeseen automation concepts. In order to assist in this process, the authors suggest a method for rapidly creating valid simulation experiments using an ontology that allows for the reuse of previous experiments and system experts knowledge.
Keywords
computational complexity; factory automation; materials handling equipment; ontologies (artificial intelligence); planning; production engineering computing; semiconductor device manufacture; automated material handling system; automated planning; automation concepts; domain specific ontology; high mix semiconductor factories; logic semiconductors; material flow simulation; power semiconductors; product changes; ramp up phases; semiconductor manufacturing AMHS; silicon wafers; simulation experiments; system experts knowledge; systems complexity; Adaptation models; Analytical models; Knowledge based systems; Manufacturing; Ontologies; Production; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), 2014 Winter
Conference_Location
Savanah, GA
Print_ISBN
978-1-4799-7484-9
Type
conf
DOI
10.1109/WSC.2014.7020107
Filename
7020107
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