• DocumentCode
    2394582
  • Title

    A Geometric Approach to Robustness in Complex Networks

  • Author

    Ranjan, Gyan ; Zhang, Zhi-Li

  • Author_Institution
    Univ. of Minnesota, Twin Cities, MN, USA
  • fYear
    2011
  • fDate
    20-24 June 2011
  • Firstpage
    146
  • Lastpage
    153
  • Abstract
    We explore the geometry of networks in terms of an n-dimensional Euclidean embedding represented by the Moore-Penrose pseudo-inverse of the graph Laplacian (L+). The reciprocal of squared distance from each node i to the origin in this n-dimensional space yields a structural centrality index (C*(i)) for the node, while the harmonic sum of individual node structural centrality indices, Σi 1/C* (i), i.e. the trace of L+, yields the well-known Kirchoff index (K), an overall structural descriptor for the network. In addition to its geometric interpretation, we provide alternative interpretation of the proposed structural centrality index (C*(i)) of each node in terms of forced detour costs and recurrences in random walks and electrical networks. Through empirical evaluation over example and real world networks, we demonstrate how structural centrality is better able to distinguish nodes in terms of their structural roles in the network and, along with Kirchoff index, is appropriately sensitive to perturbations/rewirings in the network.
  • Keywords
    complex networks; geometry; network theory (graphs); Kirchoff index; Moore-Penrose graph Laplacian pseudo inverse; complex network robustness; electrical networks; forced detour costs; geometric approach; n-dimensional Euclidean embedding; random walks; structural centrality index; Complex networks; Indexes; Logic gates; Measurement; Robustness; Topology; Complex networks; random walks; robustness; scale free networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Distributed Computing Systems Workshops (ICDCSW), 2011 31st International Conference on
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1545-0678
  • Print_ISBN
    978-1-4577-0384-3
  • Electronic_ISBN
    1545-0678
  • Type

    conf

  • DOI
    10.1109/ICDCSW.2011.18
  • Filename
    5961380