DocumentCode
2394803
Title
Competitive advantage of SOI from dynamic threshold shifts and reduced capacitance
Author
Ketchen, Mark B.
Author_Institution
Div. of Res., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2003
fDate
6-8 Oct. 2003
Firstpage
129
Lastpage
132
Abstract
In this paper, capacitance reduction and drive enhancement as a consequence of partially depleted SOI floating body topology.
Keywords
field effect transistors; silicon-on-insulator; topology; Si; capacitance reduction; partially depleted SOI floating body topology; threshold shift; Capacitance measurement; Delay; Hardware; Immune system; Inverters; Logic gates; Performance gain; Threshold voltage; Time measurement; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, Systems, and Applications, 2003 International Symposium on
ISSN
1524-766X
Print_ISBN
0-7803-7765-6
Type
conf
DOI
10.1109/VTSA.2003.1252569
Filename
1252569
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