• DocumentCode
    2395038
  • Title

    The technology of laser formed interactions for wafer scale integration

  • Author

    Chapman, Glenn H. ; Canter, Joseph M. ; Cohen, Simon S.

  • Author_Institution
    MIT Lincoln Lab., Lexington, MA, USA
  • fYear
    1989
  • fDate
    3-5 Jan 1989
  • Firstpage
    21
  • Lastpage
    29
  • Abstract
    Restructurable VLSI wafer-scale circuits have been built using two methods, both using laser energy to create low resistance connections between bus lines on already existing circuits. In one technique verticle connections of about 10 Ω are made up from top metal, through silicon nitride, to first metal lines. The other involves melting of silicon in the gap between two implant regions, with the lateral diffusion of dopants creating connections of about 100 Ω. Details of the linking structures, their characteristics, and the apparatus used to interconnect them are described
  • Keywords
    VLSI; laser beam machining; redundancy; semiconductor doping; bus lines; implant regions; laser formed interactions; lateral diffusion; linking structures; low resistance connections; melting; restructurable VLSI; verticle connections; wafer scale integration; Circuit testing; Dielectrics and electrical insulation; Integrated circuit interconnections; Joining processes; Laboratories; Laser beam cutting; Metal-insulator structures; Silicon; Very large scale integration; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1989. Proceedings., [1st] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9901-9
  • Type

    conf

  • DOI
    10.1109/WAFER.1989.47532
  • Filename
    47532